The interference spectra of thin
transparent or semi-transparent layers are measured and analyzed by our
TranSpec and
FTM-Lite film thickness gauges,
as shown in the schematic figure right beside.
The sample is illuminated
through a flexible bifurcated fiber optics cable, which is connected to the
spectrometer and a halogen lamp.
The reflected interference spectrum is guided back to the spectrometer,
where the spectrum is analyzed and the film thickness is computed.